[people/ms/u-boot.git] / include / linux / mtd / bbm.h

/*
 *  linux/include/linux/mtd/bbm.h
 *
 *  NAND family Bad Block Management (BBM) header file
 *    - Bad Block Table (BBT) implementation
 *
 *  Copyright (c) 2005-2007 Samsung Electronics
 *  Kyungmin Park <kyungmin.park@samsung.com>
 *
 *  Copyright (c) 2000-2005
 *  Thomas Gleixner <tglx@linuxtronix.de>
 *
 * This program is free software; you can redistribute it and/or modify
 * it under the terms of the GNU General Public License version 2 as
 * published by the Free Software Foundation.
 */
#ifndef __LINUX_MTD_BBM_H
#define __LINUX_MTD_BBM_H

/* The maximum number of NAND chips in an array */
#ifndef NAND_MAX_CHIPS
#define NAND_MAX_CHIPS		8
#endif

/**
 * struct nand_bbt_descr - bad block table descriptor
 * @param options	options for this descriptor
 * @param pages		the page(s) where we find the bbt, used with
 *			option BBT_ABSPAGE when bbt is searched,
 *			then we store the found bbts pages here.
 *			Its an array and supports up to 8 chips now
 * @param offs		offset of the pattern in the oob area of the page
 * @param veroffs	offset of the bbt version counter in the oob are of the page
 * @param version	version read from the bbt page during scan
 * @param len		length of the pattern, if 0 no pattern check is performed
 * @param maxblocks	maximum number of blocks to search for a bbt. This number of
 *			blocks is reserved at the end of the device
 *			where the tables are written.
 * @param reserved_block_code	if non-0, this pattern denotes a reserved
 *			(rather than bad) block in the stored bbt
 * @param pattern	pattern to identify bad block table or factory marked
 *			good / bad blocks, can be NULL, if len = 0
 *
 * Descriptor for the bad block table marker and the descriptor for the
 * pattern which identifies good and bad blocks. The assumption is made
 * that the pattern and the version count are always located in the oob area
 * of the first block.
 */
struct nand_bbt_descr {
	int options;
	int pages[NAND_MAX_CHIPS];
	int offs;
	int veroffs;
	uint8_t version[NAND_MAX_CHIPS];
	int len;
	int maxblocks;
	int reserved_block_code;
	uint8_t *pattern;
};

/* Options for the bad block table descriptors */

/* The number of bits used per block in the bbt on the device */
#define NAND_BBT_NRBITS_MSK	0x0000000F
#define NAND_BBT_1BIT		0x00000001
#define NAND_BBT_2BIT		0x00000002
#define NAND_BBT_4BIT		0x00000004
#define NAND_BBT_8BIT		0x00000008
/* The bad block table is in the last good block of the device */
#define NAND_BBT_LASTBLOCK	0x00000010
/* The bbt is at the given page, else we must scan for the bbt */
#define NAND_BBT_ABSPAGE	0x00000020
/* The bbt is at the given page, else we must scan for the bbt */
#define NAND_BBT_SEARCH		0x00000040
/* bbt is stored per chip on multichip devices */
#define NAND_BBT_PERCHIP	0x00000080
/* bbt has a version counter at offset veroffs */
#define NAND_BBT_VERSION	0x00000100
/* Create a bbt if none axists */
#define NAND_BBT_CREATE		0x00000200
/* Search good / bad pattern through all pages of a block */
#define NAND_BBT_SCANALLPAGES	0x00000400
/* Scan block empty during good / bad block scan */
#define NAND_BBT_SCANEMPTY	0x00000800
/* Write bbt if neccecary */
#define NAND_BBT_WRITE		0x00001000
/* Read and write back block contents when writing bbt */
#define NAND_BBT_SAVECONTENT	0x00002000
/* Search good / bad pattern on the first and the second page */
#define NAND_BBT_SCAN2NDPAGE	0x00004000

/* The maximum number of blocks to scan for a bbt */
#define NAND_BBT_SCAN_MAXBLOCKS	4

/*
 * Constants for oob configuration
 */
#define ONENAND_BADBLOCK_POS	0

/**
 * struct bbt_info - [GENERIC] Bad Block Table data structure
 * @param bbt_erase_shift	[INTERN] number of address bits in a bbt entry
 * @param badblockpos		[INTERN] position of the bad block marker in the oob area
 * @param bbt			[INTERN] bad block table pointer
 * @param badblock_pattern	[REPLACEABLE] bad block scan pattern used for initial bad block scan
 * @param priv			[OPTIONAL] pointer to private bbm date
 */
struct bbm_info {
	int bbt_erase_shift;
	int badblockpos;
	int options;

	uint8_t *bbt;

	int (*isbad_bbt) (struct mtd_info * mtd, loff_t ofs, int allowbbt);

	/* TODO Add more NAND specific fileds */
	struct nand_bbt_descr *badblock_pattern;

	void *priv;
};

/* OneNAND BBT interface */
extern int onenand_scan_bbt (struct mtd_info *mtd, struct nand_bbt_descr *bd);
extern int onenand_default_bbt (struct mtd_info *mtd);

#endif				/* __LINUX_MTD_BBM_H */
Commit	Line	Data
d7e8ce10 KP	1	/*
	2	* linux/include/linux/mtd/bbm.h
	3	*
	4	* NAND family Bad Block Management (BBM) header file
	5	* - Bad Block Table (BBT) implementation
	6	*
	7	* Copyright (c) 2005-2007 Samsung Electronics
	8	* Kyungmin Park <kyungmin.park@samsung.com>
	9	*
	10	* Copyright (c) 2000-2005
	11	* Thomas Gleixner <tglx@linuxtronix.de>
	12	*
	13	* This program is free software; you can redistribute it and/or modify
	14	* it under the terms of the GNU General Public License version 2 as
	15	* published by the Free Software Foundation.
	16	*/
	17	#ifndef __LINUX_MTD_BBM_H
	18	#define __LINUX_MTD_BBM_H
	19
	20	/* The maximum number of NAND chips in an array */
	21	#ifndef NAND_MAX_CHIPS
	22	#define NAND_MAX_CHIPS 8
	23	#endif
	24
	25	/**
	26	* struct nand_bbt_descr - bad block table descriptor
	27	* @param options options for this descriptor
	28	* @param pages the page(s) where we find the bbt, used with
53677ef1 WD	29	* option BBT_ABSPAGE when bbt is searched,
53677ef1 WD	30	* then we store the found bbts pages here.
d7e8ce10 KP	31	* Its an array and supports up to 8 chips now
	32	* @param offs offset of the pattern in the oob area of the page
	33	* @param veroffs offset of the bbt version counter in the oob are of the page
	34	* @param version version read from the bbt page during scan
	35	* @param len length of the pattern, if 0 no pattern check is performed
	36	* @param maxblocks maximum number of blocks to search for a bbt. This number of
	37	* blocks is reserved at the end of the device
	38	* where the tables are written.
	39	* @param reserved_block_code if non-0, this pattern denotes a reserved
	40	* (rather than bad) block in the stored bbt
	41	* @param pattern pattern to identify bad block table or factory marked
	42	* good / bad blocks, can be NULL, if len = 0
	43	*
	44	* Descriptor for the bad block table marker and the descriptor for the
	45	* pattern which identifies good and bad blocks. The assumption is made
	46	* that the pattern and the version count are always located in the oob area
	47	* of the first block.
	48	*/
	49	struct nand_bbt_descr {
	50	int options;
	51	int pages[NAND_MAX_CHIPS];
	52	int offs;
	53	int veroffs;
	54	uint8_t version[NAND_MAX_CHIPS];
	55	int len;
	56	int maxblocks;
	57	int reserved_block_code;
	58	uint8_t *pattern;
	59	};
	60
	61	/* Options for the bad block table descriptors */
	62
	63	/* The number of bits used per block in the bbt on the device */
	64	#define NAND_BBT_NRBITS_MSK 0x0000000F
	65	#define NAND_BBT_1BIT 0x00000001
	66	#define NAND_BBT_2BIT 0x00000002
	67	#define NAND_BBT_4BIT 0x00000004
	68	#define NAND_BBT_8BIT 0x00000008
	69	/* The bad block table is in the last good block of the device */
	70	#define NAND_BBT_LASTBLOCK 0x00000010
	71	/* The bbt is at the given page, else we must scan for the bbt */
	72	#define NAND_BBT_ABSPAGE 0x00000020
	73	/* The bbt is at the given page, else we must scan for the bbt */
	74	#define NAND_BBT_SEARCH 0x00000040
	75	/* bbt is stored per chip on multichip devices */
	76	#define NAND_BBT_PERCHIP 0x00000080
	77	/* bbt has a version counter at offset veroffs */
	78	#define NAND_BBT_VERSION 0x00000100
	79	/* Create a bbt if none axists */
	80	#define NAND_BBT_CREATE 0x00000200
	81	/* Search good / bad pattern through all pages of a block */
	82	#define NAND_BBT_SCANALLPAGES 0x00000400
	83	/* Scan block empty during good / bad block scan */
	84	#define NAND_BBT_SCANEMPTY 0x00000800
	85	/* Write bbt if neccecary */
	86	#define NAND_BBT_WRITE 0x00001000
	87	/* Read and write back block contents when writing bbt */
	88	#define NAND_BBT_SAVECONTENT 0x00002000
	89	/* Search good / bad pattern on the first and the second page */
	90	#define NAND_BBT_SCAN2NDPAGE 0x00004000
	91
	92	/* The maximum number of blocks to scan for a bbt */
	93	#define NAND_BBT_SCAN_MAXBLOCKS 4
	94
95	/*
96	* Constants for oob configuration
97	*/
98	#define ONENAND_BADBLOCK_POS 0
99
100	/**
101	* struct bbt_info - [GENERIC] Bad Block Table data structure
102	* @param bbt_erase_shift [INTERN] number of address bits in a bbt entry
103	* @param badblockpos [INTERN] position of the bad block marker in the oob area
104	* @param bbt [INTERN] bad block table pointer
105	* @param badblock_pattern [REPLACEABLE] bad block scan pattern used for initial bad block scan
106	* @param priv [OPTIONAL] pointer to private bbm date
107	*/
108	struct bbm_info {
109	int bbt_erase_shift;
110	int badblockpos;
111	int options;
112
113	uint8_t *bbt;
114
115	int (isbad_bbt) (struct mtd_info mtd, loff_t ofs, int allowbbt);
116
117	/* TODO Add more NAND specific fileds */
118	struct nand_bbt_descr *badblock_pattern;
119
120	void *priv;
121	};
122
123	/* OneNAND BBT interface */
124	extern int onenand_scan_bbt (struct mtd_info mtd, struct nand_bbt_descr bd);
125	extern int onenand_default_bbt (struct mtd_info *mtd);
126
127	#endif /* __LINUX_MTD_BBM_H */