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1 /*
2 * linux/include/linux/mtd/nand.h
3 *
4 * Copyright (c) 2000 David Woodhouse <dwmw2@mvhi.com>
5 * Steven J. Hill <sjhill@realitydiluted.com>
6 * Thomas Gleixner <tglx@linutronix.de>
7 *
8 * $Id: nand.h,v 1.68 2004/11/12 10:40:37 gleixner Exp $
9 *
10 * This program is free software; you can redistribute it and/or modify
11 * it under the terms of the GNU General Public License version 2 as
12 * published by the Free Software Foundation.
13 *
14 * Info:
15 * Contains standard defines and IDs for NAND flash devices
16 *
17 * Changelog:
18 * 01-31-2000 DMW Created
19 * 09-18-2000 SJH Moved structure out of the Disk-On-Chip drivers
20 * so it can be used by other NAND flash device
21 * drivers. I also changed the copyright since none
22 * of the original contents of this file are specific
23 * to DoC devices. David can whack me with a baseball
24 * bat later if I did something naughty.
25 * 10-11-2000 SJH Added private NAND flash structure for driver
26 * 10-24-2000 SJH Added prototype for 'nand_scan' function
27 * 10-29-2001 TG changed nand_chip structure to support
28 * hardwarespecific function for accessing control lines
29 * 02-21-2002 TG added support for different read/write adress and
30 * ready/busy line access function
31 * 02-26-2002 TG added chip_delay to nand_chip structure to optimize
32 * command delay times for different chips
33 * 04-28-2002 TG OOB config defines moved from nand.c to avoid duplicate
34 * defines in jffs2/wbuf.c
35 * 08-07-2002 TG forced bad block location to byte 5 of OOB, even if
36 * CONFIG_MTD_NAND_ECC_JFFS2 is not set
37 * 08-10-2002 TG extensions to nand_chip structure to support HW-ECC
38 *
39 * 08-29-2002 tglx nand_chip structure: data_poi for selecting
40 * internal / fs-driver buffer
41 * support for 6byte/512byte hardware ECC
42 * read_ecc, write_ecc extended for different oob-layout
43 * oob layout selections: NAND_NONE_OOB, NAND_JFFS2_OOB,
44 * NAND_YAFFS_OOB
45 * 11-25-2002 tglx Added Manufacturer code FUJITSU, NATIONAL
46 * Split manufacturer and device ID structures
47 *
48 * 02-08-2004 tglx added option field to nand structure for chip anomalities
49 * 05-25-2004 tglx added bad block table support, ST-MICRO manufacturer id
50 * update of nand_chip structure description
51 */
52 #ifndef __LINUX_MTD_NAND_H
53 #define __LINUX_MTD_NAND_H
54
55 #include <linux/mtd/compat.h>
56 #include <linux/mtd/mtd.h>
57
58 struct mtd_info;
59 /* Scan and identify a NAND device */
60 extern int nand_scan (struct mtd_info *mtd, int max_chips);
61 /* Free resources held by the NAND device */
62 extern void nand_release (struct mtd_info *mtd);
63
64 /* Read raw data from the device without ECC */
65 extern int nand_read_raw (struct mtd_info *mtd, uint8_t *buf, loff_t from, size_t len, size_t ooblen);
66
67
68 /* This constant declares the max. oobsize / page, which
69 * is supported now. If you add a chip with bigger oobsize/page
70 * adjust this accordingly.
71 */
72 #define NAND_MAX_OOBSIZE 64
73
74 /*
75 * Constants for hardware specific CLE/ALE/NCE function
76 */
77 /* Select the chip by setting nCE to low */
78 #define NAND_CTL_SETNCE 1
79 /* Deselect the chip by setting nCE to high */
80 #define NAND_CTL_CLRNCE 2
81 /* Select the command latch by setting CLE to high */
82 #define NAND_CTL_SETCLE 3
83 /* Deselect the command latch by setting CLE to low */
84 #define NAND_CTL_CLRCLE 4
85 /* Select the address latch by setting ALE to high */
86 #define NAND_CTL_SETALE 5
87 /* Deselect the address latch by setting ALE to low */
88 #define NAND_CTL_CLRALE 6
89 /* Set write protection by setting WP to high. Not used! */
90 #define NAND_CTL_SETWP 7
91 /* Clear write protection by setting WP to low. Not used! */
92 #define NAND_CTL_CLRWP 8
93
94 /*
95 * Standard NAND flash commands
96 */
97 #define NAND_CMD_READ0 0
98 #define NAND_CMD_READ1 1
99 #define NAND_CMD_PAGEPROG 0x10
100 #define NAND_CMD_READOOB 0x50
101 #define NAND_CMD_ERASE1 0x60
102 #define NAND_CMD_STATUS 0x70
103 #define NAND_CMD_STATUS_MULTI 0x71
104 #define NAND_CMD_SEQIN 0x80
105 #define NAND_CMD_READID 0x90
106 #define NAND_CMD_ERASE2 0xd0
107 #define NAND_CMD_RESET 0xff
108
109 /* Extended commands for large page devices */
110 #define NAND_CMD_READSTART 0x30
111 #define NAND_CMD_CACHEDPROG 0x15
112
113 /* Status bits */
114 #define NAND_STATUS_FAIL 0x01
115 #define NAND_STATUS_FAIL_N1 0x02
116 #define NAND_STATUS_TRUE_READY 0x20
117 #define NAND_STATUS_READY 0x40
118 #define NAND_STATUS_WP 0x80
119
120 /*
121 * Constants for ECC_MODES
122 */
123
124 /* No ECC. Usage is not recommended ! */
125 #define NAND_ECC_NONE 0
126 /* Software ECC 3 byte ECC per 256 Byte data */
127 #define NAND_ECC_SOFT 1
128 /* Hardware ECC 3 byte ECC per 256 Byte data */
129 #define NAND_ECC_HW3_256 2
130 /* Hardware ECC 3 byte ECC per 512 Byte data */
131 #define NAND_ECC_HW3_512 3
132 /* Hardware ECC 6 byte ECC per 512 Byte data */
133 #define NAND_ECC_HW6_512 4
134 /* Hardware ECC 8 byte ECC per 512 Byte data */
135 #define NAND_ECC_HW8_512 6
136 /* Hardware ECC 12 byte ECC per 2048 Byte data */
137 #define NAND_ECC_HW12_2048 7
138
139 /*
140 * Constants for Hardware ECC
141 */
142 /* Reset Hardware ECC for read */
143 #define NAND_ECC_READ 0
144 /* Reset Hardware ECC for write */
145 #define NAND_ECC_WRITE 1
146 /* Enable Hardware ECC before syndrom is read back from flash */
147 #define NAND_ECC_READSYN 2
148
149 /* Option constants for bizarre disfunctionality and real
150 * features
151 */
152 /* Chip can not auto increment pages */
153 #define NAND_NO_AUTOINCR 0x00000001
154 /* Buswitdh is 16 bit */
155 #define NAND_BUSWIDTH_16 0x00000002
156 /* Device supports partial programming without padding */
157 #define NAND_NO_PADDING 0x00000004
158 /* Chip has cache program function */
159 #define NAND_CACHEPRG 0x00000008
160 /* Chip has copy back function */
161 #define NAND_COPYBACK 0x00000010
162 /* AND Chip which has 4 banks and a confusing page / block
163 * assignment. See Renesas datasheet for further information */
164 #define NAND_IS_AND 0x00000020
165 /* Chip has a array of 4 pages which can be read without
166 * additional ready /busy waits */
167 #define NAND_4PAGE_ARRAY 0x00000040
168
169 /* Options valid for Samsung large page devices */
170 #define NAND_SAMSUNG_LP_OPTIONS \
171 (NAND_NO_PADDING | NAND_CACHEPRG | NAND_COPYBACK)
172
173 /* Macros to identify the above */
174 #define NAND_CANAUTOINCR(chip) (!(chip->options & NAND_NO_AUTOINCR))
175 #define NAND_MUST_PAD(chip) (!(chip->options & NAND_NO_PADDING))
176 #define NAND_HAS_CACHEPROG(chip) ((chip->options & NAND_CACHEPRG))
177 #define NAND_HAS_COPYBACK(chip) ((chip->options & NAND_COPYBACK))
178
179 /* Mask to zero out the chip options, which come from the id table */
180 #define NAND_CHIPOPTIONS_MSK (0x0000ffff & ~NAND_NO_AUTOINCR)
181
182 /* Non chip related options */
183 /* Use a flash based bad block table. This option is passed to the
184 * default bad block table function. */
185 #define NAND_USE_FLASH_BBT 0x00010000
186 /* The hw ecc generator provides a syndrome instead a ecc value on read
187 * This can only work if we have the ecc bytes directly behind the
188 * data bytes. Applies for DOC and AG-AND Renesas HW Reed Solomon generators */
189 #define NAND_HWECC_SYNDROME 0x00020000
190
191
192 /* Options set by nand scan */
193 /* Nand scan has allocated oob_buf */
194 #define NAND_OOBBUF_ALLOC 0x40000000
195 /* Nand scan has allocated data_buf */
196 #define NAND_DATABUF_ALLOC 0x80000000
197
198
199 /*
200 * nand_state_t - chip states
201 * Enumeration for NAND flash chip state
202 */
203 typedef enum {
204 FL_READY,
205 FL_READING,
206 FL_WRITING,
207 FL_ERASING,
208 FL_SYNCING,
209 FL_CACHEDPRG,
210 } nand_state_t;
211
212 /* Keep gcc happy */
213 struct nand_chip;
214
215 #if 0
216 /**
217 * struct nand_hw_control - Control structure for hardware controller (e.g ECC generator) shared among independend devices
218 * @lock: protection lock
219 * @active: the mtd device which holds the controller currently
220 */
221 struct nand_hw_control {
222 spinlock_t lock;
223 struct nand_chip *active;
224 };
225 #endif
226
227 /**
228 * struct nand_chip - NAND Private Flash Chip Data
229 * @IO_ADDR_R: [BOARDSPECIFIC] address to read the 8 I/O lines of the flash device
230 * @IO_ADDR_W: [BOARDSPECIFIC] address to write the 8 I/O lines of the flash device
231 * @read_byte: [REPLACEABLE] read one byte from the chip
232 * @write_byte: [REPLACEABLE] write one byte to the chip
233 * @read_word: [REPLACEABLE] read one word from the chip
234 * @write_word: [REPLACEABLE] write one word to the chip
235 * @write_buf: [REPLACEABLE] write data from the buffer to the chip
236 * @read_buf: [REPLACEABLE] read data from the chip into the buffer
237 * @verify_buf: [REPLACEABLE] verify buffer contents against the chip data
238 * @select_chip: [REPLACEABLE] select chip nr
239 * @block_bad: [REPLACEABLE] check, if the block is bad
240 * @block_markbad: [REPLACEABLE] mark the block bad
241 * @hwcontrol: [BOARDSPECIFIC] hardwarespecific function for accesing control-lines
242 * @dev_ready: [BOARDSPECIFIC] hardwarespecific function for accesing device ready/busy line
243 * If set to NULL no access to ready/busy is available and the ready/busy information
244 * is read from the chip status register
245 * @cmdfunc: [REPLACEABLE] hardwarespecific function for writing commands to the chip
246 * @waitfunc: [REPLACEABLE] hardwarespecific function for wait on ready
247 * @calculate_ecc: [REPLACEABLE] function for ecc calculation or readback from ecc hardware
248 * @correct_data: [REPLACEABLE] function for ecc correction, matching to ecc generator (sw/hw)
249 * @enable_hwecc: [BOARDSPECIFIC] function to enable (reset) hardware ecc generator. Must only
250 * be provided if a hardware ECC is available
251 * @erase_cmd: [INTERN] erase command write function, selectable due to AND support
252 * @scan_bbt: [REPLACEABLE] function to scan bad block table
253 * @eccmode: [BOARDSPECIFIC] mode of ecc, see defines
254 * @eccsize: [INTERN] databytes used per ecc-calculation
255 * @eccbytes: [INTERN] number of ecc bytes per ecc-calculation step
256 * @eccsteps: [INTERN] number of ecc calculation steps per page
257 * @chip_delay: [BOARDSPECIFIC] chip dependent delay for transfering data from array to read regs (tR)
258 * @chip_lock: [INTERN] spinlock used to protect access to this structure and the chip
259 * @wq: [INTERN] wait queue to sleep on if a NAND operation is in progress
260 * @state: [INTERN] the current state of the NAND device
261 * @page_shift: [INTERN] number of address bits in a page (column address bits)
262 * @phys_erase_shift: [INTERN] number of address bits in a physical eraseblock
263 * @bbt_erase_shift: [INTERN] number of address bits in a bbt entry
264 * @chip_shift: [INTERN] number of address bits in one chip
265 * @data_buf: [INTERN] internal buffer for one page + oob
266 * @oob_buf: [INTERN] oob buffer for one eraseblock
267 * @oobdirty: [INTERN] indicates that oob_buf must be reinitialized
268 * @data_poi: [INTERN] pointer to a data buffer
269 * @options: [BOARDSPECIFIC] various chip options. They can partly be set to inform nand_scan about
270 * special functionality. See the defines for further explanation
271 * @badblockpos: [INTERN] position of the bad block marker in the oob area
272 * @numchips: [INTERN] number of physical chips
273 * @chipsize: [INTERN] the size of one chip for multichip arrays
274 * @pagemask: [INTERN] page number mask = number of (pages / chip) - 1
275 * @pagebuf: [INTERN] holds the pagenumber which is currently in data_buf
276 * @autooob: [REPLACEABLE] the default (auto)placement scheme
277 * @bbt: [INTERN] bad block table pointer
278 * @bbt_td: [REPLACEABLE] bad block table descriptor for flash lookup
279 * @bbt_md: [REPLACEABLE] bad block table mirror descriptor
280 * @badblock_pattern: [REPLACEABLE] bad block scan pattern used for initial bad block scan
281 * @controller: [OPTIONAL] a pointer to a hardware controller structure which is shared among multiple independend devices
282 * @priv: [OPTIONAL] pointer to private chip date
283 */
284
285 struct nand_chip {
286 void __iomem *IO_ADDR_R;
287 void __iomem *IO_ADDR_W;
288
289 u_char (*read_byte)(struct mtd_info *mtd);
290 void (*write_byte)(struct mtd_info *mtd, u_char byte);
291 u16 (*read_word)(struct mtd_info *mtd);
292 void (*write_word)(struct mtd_info *mtd, u16 word);
293
294 void (*write_buf)(struct mtd_info *mtd, const u_char *buf, int len);
295 void (*read_buf)(struct mtd_info *mtd, u_char *buf, int len);
296 int (*verify_buf)(struct mtd_info *mtd, const u_char *buf, int len);
297 void (*select_chip)(struct mtd_info *mtd, int chip);
298 int (*block_bad)(struct mtd_info *mtd, loff_t ofs, int getchip);
299 int (*block_markbad)(struct mtd_info *mtd, loff_t ofs);
300 void (*hwcontrol)(struct mtd_info *mtd, int cmd);
301 int (*dev_ready)(struct mtd_info *mtd);
302 void (*cmdfunc)(struct mtd_info *mtd, unsigned command, int column, int page_addr);
303 int (*waitfunc)(struct mtd_info *mtd, struct nand_chip *this, int state);
304 int (*calculate_ecc)(struct mtd_info *mtd, const u_char *dat, u_char *ecc_code);
305 int (*correct_data)(struct mtd_info *mtd, u_char *dat, u_char *read_ecc, u_char *calc_ecc);
306 void (*enable_hwecc)(struct mtd_info *mtd, int mode);
307 void (*erase_cmd)(struct mtd_info *mtd, int page);
308 int (*scan_bbt)(struct mtd_info *mtd);
309 int eccmode;
310 int eccsize;
311 int eccbytes;
312 int eccsteps;
313 int chip_delay;
314 #if 0
315 spinlock_t chip_lock;
316 wait_queue_head_t wq;
317 nand_state_t state;
318 #endif
319 int page_shift;
320 int phys_erase_shift;
321 int bbt_erase_shift;
322 int chip_shift;
323 u_char *data_buf;
324 u_char *oob_buf;
325 int oobdirty;
326 u_char *data_poi;
327 unsigned int options;
328 int badblockpos;
329 int numchips;
330 unsigned long chipsize;
331 int pagemask;
332 int pagebuf;
333 struct nand_oobinfo *autooob;
334 uint8_t *bbt;
335 struct nand_bbt_descr *bbt_td;
336 struct nand_bbt_descr *bbt_md;
337 struct nand_bbt_descr *badblock_pattern;
338 struct nand_hw_control *controller;
339 void *priv;
340 };
341
342 /*
343 * NAND Flash Manufacturer ID Codes
344 */
345 #define NAND_MFR_TOSHIBA 0x98
346 #define NAND_MFR_SAMSUNG 0xec
347 #define NAND_MFR_FUJITSU 0x04
348 #define NAND_MFR_NATIONAL 0x8f
349 #define NAND_MFR_RENESAS 0x07
350 #define NAND_MFR_STMICRO 0x20
351 #define NAND_MFR_MICRON 0x2c
352
353 /**
354 * struct nand_flash_dev - NAND Flash Device ID Structure
355 *
356 * @name: Identify the device type
357 * @id: device ID code
358 * @pagesize: Pagesize in bytes. Either 256 or 512 or 0
359 * If the pagesize is 0, then the real pagesize
360 * and the eraseize are determined from the
361 * extended id bytes in the chip
362 * @erasesize: Size of an erase block in the flash device.
363 * @chipsize: Total chipsize in Mega Bytes
364 * @options: Bitfield to store chip relevant options
365 */
366 struct nand_flash_dev {
367 char *name;
368 int id;
369 unsigned long pagesize;
370 unsigned long chipsize;
371 unsigned long erasesize;
372 unsigned long options;
373 };
374
375 /**
376 * struct nand_manufacturers - NAND Flash Manufacturer ID Structure
377 * @name: Manufacturer name
378 * @id: manufacturer ID code of device.
379 */
380 struct nand_manufacturers {
381 int id;
382 char * name;
383 };
384
385 extern struct nand_flash_dev nand_flash_ids[];
386 extern struct nand_manufacturers nand_manuf_ids[];
387
388 #ifndef NAND_MAX_CHIPS
389 #define NAND_MAX_CHIPS 8
390 #endif
391
392 /**
393 * struct nand_bbt_descr - bad block table descriptor
394 * @options: options for this descriptor
395 * @pages: the page(s) where we find the bbt, used with option BBT_ABSPAGE
396 * when bbt is searched, then we store the found bbts pages here.
397 * Its an array and supports up to 8 chips now
398 * @offs: offset of the pattern in the oob area of the page
399 * @veroffs: offset of the bbt version counter in the oob are of the page
400 * @version: version read from the bbt page during scan
401 * @len: length of the pattern, if 0 no pattern check is performed
402 * @maxblocks: maximum number of blocks to search for a bbt. This number of
403 * blocks is reserved at the end of the device where the tables are
404 * written.
405 * @reserved_block_code: if non-0, this pattern denotes a reserved (rather than
406 * bad) block in the stored bbt
407 * @pattern: pattern to identify bad block table or factory marked good /
408 * bad blocks, can be NULL, if len = 0
409 *
410 * Descriptor for the bad block table marker and the descriptor for the
411 * pattern which identifies good and bad blocks. The assumption is made
412 * that the pattern and the version count are always located in the oob area
413 * of the first block.
414 */
415 struct nand_bbt_descr {
416 int options;
417 int pages[NAND_MAX_CHIPS];
418 int offs;
419 int veroffs;
420 uint8_t version[NAND_MAX_CHIPS];
421 int len;
422 int maxblocks;
423 int reserved_block_code;
424 uint8_t *pattern;
425 };
426
427 /* Options for the bad block table descriptors */
428
429 /* The number of bits used per block in the bbt on the device */
430 #define NAND_BBT_NRBITS_MSK 0x0000000F
431 #define NAND_BBT_1BIT 0x00000001
432 #define NAND_BBT_2BIT 0x00000002
433 #define NAND_BBT_4BIT 0x00000004
434 #define NAND_BBT_8BIT 0x00000008
435 /* The bad block table is in the last good block of the device */
436 #define NAND_BBT_LASTBLOCK 0x00000010
437 /* The bbt is at the given page, else we must scan for the bbt */
438 #define NAND_BBT_ABSPAGE 0x00000020
439 /* The bbt is at the given page, else we must scan for the bbt */
440 #define NAND_BBT_SEARCH 0x00000040
441 /* bbt is stored per chip on multichip devices */
442 #define NAND_BBT_PERCHIP 0x00000080
443 /* bbt has a version counter at offset veroffs */
444 #define NAND_BBT_VERSION 0x00000100
445 /* Create a bbt if none axists */
446 #define NAND_BBT_CREATE 0x00000200
447 /* Search good / bad pattern through all pages of a block */
448 #define NAND_BBT_SCANALLPAGES 0x00000400
449 /* Scan block empty during good / bad block scan */
450 #define NAND_BBT_SCANEMPTY 0x00000800
451 /* Write bbt if neccecary */
452 #define NAND_BBT_WRITE 0x00001000
453 /* Read and write back block contents when writing bbt */
454 #define NAND_BBT_SAVECONTENT 0x00002000
455 /* Search good / bad pattern on the first and the second page */
456 #define NAND_BBT_SCAN2NDPAGE 0x00004000
457
458 /* The maximum number of blocks to scan for a bbt */
459 #define NAND_BBT_SCAN_MAXBLOCKS 4
460
461 extern int nand_scan_bbt (struct mtd_info *mtd, struct nand_bbt_descr *bd);
462 extern int nand_update_bbt (struct mtd_info *mtd, loff_t offs);
463 extern int nand_default_bbt (struct mtd_info *mtd);
464 extern int nand_isbad_bbt (struct mtd_info *mtd, loff_t offs, int allowbbt);
465 extern int nand_erase_nand (struct mtd_info *mtd, struct erase_info *instr, int allowbbt);
466
467 /*
468 * Constants for oob configuration
469 */
470 #define NAND_SMALL_BADBLOCK_POS 5
471 #define NAND_LARGE_BADBLOCK_POS 0
472
473 #endif /* __LINUX_MTD_NAND_H */