[people/ms/u-boot.git] / include / linux / mtd / bbm.h

/*
 *  linux/include/linux/mtd/bbm.h
 *
 *  NAND family Bad Block Management (BBM) header file
 *    - Bad Block Table (BBT) implementation
 *
 *  Copyright (c) 2005-2007 Samsung Electronics
 *  Kyungmin Park <kyungmin.park@samsung.com>
 *
 *  Copyright (c) 2000-2005
 *  Thomas Gleixner <tglx@linuxtronix.de>
 *
 * This program is free software; you can redistribute it and/or modify
 * it under the terms of the GNU General Public License as published by
 * the Free Software Foundation; either version 2 of the License, or
 * (at your option) any later version.
 *
 * This program is distributed in the hope that it will be useful,
 * but WITHOUT ANY WARRANTY; without even the implied warranty of
 * MERCHANTABILITY or FITNESS FOR A PARTICULAR PURPOSE.  See the
 * GNU General Public License for more details.
 *
 * You should have received a copy of the GNU General Public License
 * along with this program; if not, write to the Free Software
 * Foundation, Inc., 51 Franklin St, Fifth Floor, Boston, MA  02110-1301  USA
 *
 */
#ifndef __LINUX_MTD_BBM_H
#define __LINUX_MTD_BBM_H

/* The maximum number of NAND chips in an array */
#ifndef CONFIG_SYS_NAND_MAX_CHIPS
#define CONFIG_SYS_NAND_MAX_CHIPS	1
#endif

/**
 * struct nand_bbt_descr - bad block table descriptor
 * @param options	options for this descriptor
 * @param pages		the page(s) where we find the bbt, used with
 *			option BBT_ABSPAGE when bbt is searched,
 *			then we store the found bbts pages here.
 *			Its an array and supports up to 8 chips now
 * @param offs		offset of the pattern in the oob area of the page
 * @param veroffs	offset of the bbt version counter in the oob are of the page
 * @param version	version read from the bbt page during scan
 * @param len		length of the pattern, if 0 no pattern check is performed
 * @param maxblocks	maximum number of blocks to search for a bbt. This number of
 *			blocks is reserved at the end of the device
 *			where the tables are written.
 * @param reserved_block_code	if non-0, this pattern denotes a reserved
 *			(rather than bad) block in the stored bbt
 * @param pattern	pattern to identify bad block table or factory marked
 *			good / bad blocks, can be NULL, if len = 0
 *
 * Descriptor for the bad block table marker and the descriptor for the
 * pattern which identifies good and bad blocks. The assumption is made
 * that the pattern and the version count are always located in the oob area
 * of the first block.
 */
struct nand_bbt_descr {
	int options;
	int pages[CONFIG_SYS_NAND_MAX_CHIPS];
	int offs;
	int veroffs;
	uint8_t version[CONFIG_SYS_NAND_MAX_CHIPS];
	int len;
	int maxblocks;
	int reserved_block_code;
	uint8_t *pattern;
};

/* Options for the bad block table descriptors */

/* The number of bits used per block in the bbt on the device */
#define NAND_BBT_NRBITS_MSK	0x0000000F
#define NAND_BBT_1BIT		0x00000001
#define NAND_BBT_2BIT		0x00000002
#define NAND_BBT_4BIT		0x00000004
#define NAND_BBT_8BIT		0x00000008
/* The bad block table is in the last good block of the device */
#define NAND_BBT_LASTBLOCK	0x00000010
/* The bbt is at the given page, else we must scan for the bbt */
#define NAND_BBT_ABSPAGE	0x00000020
/* The bbt is at the given page, else we must scan for the bbt */
#define NAND_BBT_SEARCH		0x00000040
/* bbt is stored per chip on multichip devices */
#define NAND_BBT_PERCHIP	0x00000080
/* bbt has a version counter at offset veroffs */
#define NAND_BBT_VERSION	0x00000100
/* Create a bbt if none exists */
#define NAND_BBT_CREATE		0x00000200
/* Search good / bad pattern through all pages of a block */
#define NAND_BBT_SCANALLPAGES	0x00000400
/* Scan block empty during good / bad block scan */
#define NAND_BBT_SCANEMPTY	0x00000800
/* Write bbt if neccecary */
#define NAND_BBT_WRITE		0x00001000
/* Read and write back block contents when writing bbt */
#define NAND_BBT_SAVECONTENT	0x00002000
/* Search good / bad pattern on the first and the second page */
#define NAND_BBT_SCAN2NDPAGE	0x00004000
/* Search good / bad pattern on the last page of the eraseblock */
#define NAND_BBT_SCANLASTPAGE	0x00008000
/* Chip stores bad block marker on BOTH 1st and 6th bytes of OOB */
#define NAND_BBT_SCANBYTE1AND6 0x00100000
/* The nand_bbt_descr was created dynamicaly and must be freed */
#define NAND_BBT_DYNAMICSTRUCT 0x00200000
/* The bad block table does not OOB for marker */
#define NAND_BBT_NO_OOB		0x00400000

/* The maximum number of blocks to scan for a bbt */
#define NAND_BBT_SCAN_MAXBLOCKS	4

/*
 * Constants for oob configuration
 */
#define ONENAND_BADBLOCK_POS	0

/*
 * Bad block scanning errors
 */
#define ONENAND_BBT_READ_ERROR          1
#define ONENAND_BBT_READ_ECC_ERROR      2
#define ONENAND_BBT_READ_FATAL_ERROR    4

/**
 * struct bbt_info - [GENERIC] Bad Block Table data structure
 * @param bbt_erase_shift	[INTERN] number of address bits in a bbt entry
 * @param badblockpos		[INTERN] position of the bad block marker in the oob area
 * @param bbt			[INTERN] bad block table pointer
 * @param badblock_pattern	[REPLACEABLE] bad block scan pattern used for initial bad block scan
 * @param priv			[OPTIONAL] pointer to private bbm date
 */
struct bbm_info {
	int bbt_erase_shift;
	int badblockpos;
	int options;

	uint8_t *bbt;

	int (*isbad_bbt) (struct mtd_info * mtd, loff_t ofs, int allowbbt);

	/* TODO Add more NAND specific fileds */
	struct nand_bbt_descr *badblock_pattern;

	void *priv;
};

/* OneNAND BBT interface */
extern int onenand_scan_bbt (struct mtd_info *mtd, struct nand_bbt_descr *bd);
extern int onenand_default_bbt (struct mtd_info *mtd);

#endif				/* __LINUX_MTD_BBM_H */
Commit	Line	Data
d7e8ce10 KP	1	/*
	2	* linux/include/linux/mtd/bbm.h
	3	*
	4	* NAND family Bad Block Management (BBM) header file
	5	* - Bad Block Table (BBT) implementation
	6	*
	7	* Copyright (c) 2005-2007 Samsung Electronics
	8	* Kyungmin Park <kyungmin.park@samsung.com>
	9	*
	10	* Copyright (c) 2000-2005
	11	* Thomas Gleixner <tglx@linuxtronix.de>
	12	*
	13	* This program is free software; you can redistribute it and/or modify
2a8e0fc8 CH	14	* it under the terms of the GNU General Public License as published by
	15	* the Free Software Foundation; either version 2 of the License, or
	16	* (at your option) any later version.
	17	*
	18	* This program is distributed in the hope that it will be useful,
	19	* but WITHOUT ANY WARRANTY; without even the implied warranty of
	20	* MERCHANTABILITY or FITNESS FOR A PARTICULAR PURPOSE. See the
	21	* GNU General Public License for more details.
	22	*
	23	* You should have received a copy of the GNU General Public License
	24	* along with this program; if not, write to the Free Software
	25	* Foundation, Inc., 51 Franklin St, Fifth Floor, Boston, MA 02110-1301 USA
	26	*
d7e8ce10 KP	27	*/
	28	#ifndef __LINUX_MTD_BBM_H
	29	#define __LINUX_MTD_BBM_H
	30
	31	/* The maximum number of NAND chips in an array */
6c869637 WG	32	#ifndef CONFIG_SYS_NAND_MAX_CHIPS
6c869637 WG	33	#define CONFIG_SYS_NAND_MAX_CHIPS 1
d7e8ce10 KP	34	#endif
	35
	36	/**
	37	* struct nand_bbt_descr - bad block table descriptor
	38	* @param options options for this descriptor
	39	* @param pages the page(s) where we find the bbt, used with
53677ef1 WD	40	* option BBT_ABSPAGE when bbt is searched,
53677ef1 WD	41	* then we store the found bbts pages here.
d7e8ce10 KP	42	* Its an array and supports up to 8 chips now
	43	* @param offs offset of the pattern in the oob area of the page
	44	* @param veroffs offset of the bbt version counter in the oob are of the page
	45	* @param version version read from the bbt page during scan
	46	* @param len length of the pattern, if 0 no pattern check is performed
	47	* @param maxblocks maximum number of blocks to search for a bbt. This number of
	48	* blocks is reserved at the end of the device
	49	* where the tables are written.
	50	* @param reserved_block_code if non-0, this pattern denotes a reserved
	51	* (rather than bad) block in the stored bbt
	52	* @param pattern pattern to identify bad block table or factory marked
	53	* good / bad blocks, can be NULL, if len = 0
	54	*
	55	* Descriptor for the bad block table marker and the descriptor for the
	56	* pattern which identifies good and bad blocks. The assumption is made
	57	* that the pattern and the version count are always located in the oob area
	58	* of the first block.
	59	*/
	60	struct nand_bbt_descr {
	61	int options;
6c869637	62	int pages[CONFIG_SYS_NAND_MAX_CHIPS];
d7e8ce10 KP	63	int offs;
d7e8ce10 KP	64	int veroffs;
6c869637	65	uint8_t version[CONFIG_SYS_NAND_MAX_CHIPS];
d7e8ce10 KP	66	int len;
	67	int maxblocks;
	68	int reserved_block_code;
	69	uint8_t *pattern;
	70	};
	71
	72	/* Options for the bad block table descriptors */
	73
	74	/* The number of bits used per block in the bbt on the device */
	75	#define NAND_BBT_NRBITS_MSK 0x0000000F
	76	#define NAND_BBT_1BIT 0x00000001
	77	#define NAND_BBT_2BIT 0x00000002
	78	#define NAND_BBT_4BIT 0x00000004
	79	#define NAND_BBT_8BIT 0x00000008
	80	/* The bad block table is in the last good block of the device */
	81	#define NAND_BBT_LASTBLOCK 0x00000010
	82	/* The bbt is at the given page, else we must scan for the bbt */
	83	#define NAND_BBT_ABSPAGE 0x00000020
	84	/* The bbt is at the given page, else we must scan for the bbt */
	85	#define NAND_BBT_SEARCH 0x00000040
	86	/* bbt is stored per chip on multichip devices */
	87	#define NAND_BBT_PERCHIP 0x00000080
	88	/* bbt has a version counter at offset veroffs */
	89	#define NAND_BBT_VERSION 0x00000100
2a8e0fc8	90	/* Create a bbt if none exists */
d7e8ce10 KP	91	#define NAND_BBT_CREATE 0x00000200
	92	/* Search good / bad pattern through all pages of a block */
	93	#define NAND_BBT_SCANALLPAGES 0x00000400
	94	/* Scan block empty during good / bad block scan */
	95	#define NAND_BBT_SCANEMPTY 0x00000800
	96	/* Write bbt if neccecary */
	97	#define NAND_BBT_WRITE 0x00001000
	98	/* Read and write back block contents when writing bbt */
	99	#define NAND_BBT_SAVECONTENT 0x00002000
	100	/* Search good / bad pattern on the first and the second page */
	101	#define NAND_BBT_SCAN2NDPAGE 0x00004000
2a8e0fc8 CH	102	/* Search good / bad pattern on the last page of the eraseblock */
	103	#define NAND_BBT_SCANLASTPAGE 0x00008000
	104	/* Chip stores bad block marker on BOTH 1st and 6th bytes of OOB */
	105	#define NAND_BBT_SCANBYTE1AND6 0x00100000
	106	/* The nand_bbt_descr was created dynamicaly and must be freed */
	107	#define NAND_BBT_DYNAMICSTRUCT 0x00200000
ff8a8a71 CH	108	/* The bad block table does not OOB for marker */
ff8a8a71 CH	109	#define NAND_BBT_NO_OOB 0x00400000
d7e8ce10 KP	110
	111	/* The maximum number of blocks to scan for a bbt */
	112	#define NAND_BBT_SCAN_MAXBLOCKS 4
	113
	114	/*
	115	* Constants for oob configuration
	116	*/
	117	#define ONENAND_BADBLOCK_POS 0
	118
bfd7f386 KP	119	/*
	120	* Bad block scanning errors
	121	*/
	122	#define ONENAND_BBT_READ_ERROR 1
	123	#define ONENAND_BBT_READ_ECC_ERROR 2
	124	#define ONENAND_BBT_READ_FATAL_ERROR 4
	125
d7e8ce10 KP	126	/**
	127	* struct bbt_info - [GENERIC] Bad Block Table data structure
	128	* @param bbt_erase_shift [INTERN] number of address bits in a bbt entry
	129	* @param badblockpos [INTERN] position of the bad block marker in the oob area
	130	* @param bbt [INTERN] bad block table pointer
	131	* @param badblock_pattern [REPLACEABLE] bad block scan pattern used for initial bad block scan
	132	* @param priv [OPTIONAL] pointer to private bbm date
	133	*/
	134	struct bbm_info {
	135	int bbt_erase_shift;
	136	int badblockpos;
	137	int options;
	138
	139	uint8_t *bbt;
	140
	141	int (isbad_bbt) (struct mtd_info mtd, loff_t ofs, int allowbbt);
	142
	143	/* TODO Add more NAND specific fileds */
	144	struct nand_bbt_descr *badblock_pattern;
	145
	146	void *priv;
	147	};
	148
	149	/* OneNAND BBT interface */
	150	extern int onenand_scan_bbt (struct mtd_info mtd, struct nand_bbt_descr bd);
	151	extern int onenand_default_bbt (struct mtd_info *mtd);
	152
	153	#endif /* __LINUX_MTD_BBM_H */