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0ae0cb7b SG |
1 | /* |
2 | * Copyright (C) 2013 Google, Inc | |
3 | * | |
4 | * SPDX-License-Identifier: GPL-2.0+ | |
5 | */ | |
6 | ||
7 | #include <common.h> | |
8 | #include <dm.h> | |
9 | #include <fdtdec.h> | |
10 | #include <spi.h> | |
11 | #include <spi_flash.h> | |
12 | #include <asm/state.h> | |
0ae0cb7b SG |
13 | #include <dm/test.h> |
14 | #include <dm/util.h> | |
e721b882 | 15 | #include <test/ut.h> |
0ae0cb7b SG |
16 | |
17 | /* Test that sandbox SPI flash works correctly */ | |
e721b882 | 18 | static int dm_test_spi_flash(struct unit_test_state *uts) |
0ae0cb7b SG |
19 | { |
20 | /* | |
21 | * Create an empty test file and run the SPI flash tests. This is a | |
22 | * long way from being a unit test, but it does test SPI device and | |
23 | * emulator binding, probing, the SPI flash emulator including | |
24 | * device tree decoding, plus the file-based backing store of SPI. | |
25 | * | |
26 | * More targeted tests could be created to perform the above steps | |
27 | * one at a time. This might not increase test coverage much, but | |
28 | * it would make bugs easier to find. It's not clear whether the | |
29 | * benefit is worth the extra complexity. | |
30 | */ | |
31 | ut_asserteq(0, run_command_list( | |
b5493d17 | 32 | "sb save hostfs - 0 spi.bin 200000;" |
0ae0cb7b SG |
33 | "sf probe;" |
34 | "sf test 0 10000", -1, 0)); | |
35 | /* | |
36 | * Since we are about to destroy all devices, we must tell sandbox | |
37 | * to forget the emulation device | |
38 | */ | |
39 | sandbox_sf_unbind_emul(state_get_current(), 0, 0); | |
40 | ||
41 | return 0; | |
42 | } | |
43 | DM_TEST(dm_test_spi_flash, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT); |