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1 /*
2 * linux/include/linux/mtd/nand.h
3 *
4 * Copyright (c) 2000 David Woodhouse <dwmw2@mvhi.com>
5 * Steven J. Hill <sjhill@realitydiluted.com>
6 * Thomas Gleixner <tglx@linutronix.de>
7 *
8 * $Id: nand.h,v 1.68 2004/11/12 10:40:37 gleixner Exp $
9 *
10 * This program is free software; you can redistribute it and/or modify
11 * it under the terms of the GNU General Public License version 2 as
12 * published by the Free Software Foundation.
13 *
14 * Info:
15 * Contains standard defines and IDs for NAND flash devices
16 *
17 * Changelog:
18 * 01-31-2000 DMW Created
19 * 09-18-2000 SJH Moved structure out of the Disk-On-Chip drivers
20 * so it can be used by other NAND flash device
21 * drivers. I also changed the copyright since none
22 * of the original contents of this file are specific
23 * to DoC devices. David can whack me with a baseball
24 * bat later if I did something naughty.
25 * 10-11-2000 SJH Added private NAND flash structure for driver
26 * 10-24-2000 SJH Added prototype for 'nand_scan' function
27 * 10-29-2001 TG changed nand_chip structure to support
28 * hardwarespecific function for accessing control lines
29 * 02-21-2002 TG added support for different read/write adress and
30 * ready/busy line access function
31 * 02-26-2002 TG added chip_delay to nand_chip structure to optimize
32 * command delay times for different chips
33 * 04-28-2002 TG OOB config defines moved from nand.c to avoid duplicate
34 * defines in jffs2/wbuf.c
35 * 08-07-2002 TG forced bad block location to byte 5 of OOB, even if
36 * CONFIG_MTD_NAND_ECC_JFFS2 is not set
37 * 08-10-2002 TG extensions to nand_chip structure to support HW-ECC
38 *
39 * 08-29-2002 tglx nand_chip structure: data_poi for selecting
40 * internal / fs-driver buffer
41 * support for 6byte/512byte hardware ECC
42 * read_ecc, write_ecc extended for different oob-layout
43 * oob layout selections: NAND_NONE_OOB, NAND_JFFS2_OOB,
44 * NAND_YAFFS_OOB
45 * 11-25-2002 tglx Added Manufacturer code FUJITSU, NATIONAL
46 * Split manufacturer and device ID structures
47 *
48 * 02-08-2004 tglx added option field to nand structure for chip anomalities
49 * 05-25-2004 tglx added bad block table support, ST-MICRO manufacturer id
50 * update of nand_chip structure description
51 */
52 #ifndef __LINUX_MTD_NAND_H
53 #define __LINUX_MTD_NAND_H
54
55 #include <linux/mtd/compat.h>
56 #include <linux/mtd/mtd.h>
57
58 struct mtd_info;
59 /* Scan and identify a NAND device */
60 extern int nand_scan (struct mtd_info *mtd, int max_chips);
61 /* Free resources held by the NAND device */
62 extern void nand_release (struct mtd_info *mtd);
63
64 /* Read raw data from the device without ECC */
65 extern int nand_read_raw (struct mtd_info *mtd, uint8_t *buf, loff_t from, size_t len, size_t ooblen);
66
67
68 /* The maximum number of NAND chips in an array */
69 #define NAND_MAX_CHIPS 8
70
71 /* This constant declares the max. oobsize / page, which
72 * is supported now. If you add a chip with bigger oobsize/page
73 * adjust this accordingly.
74 */
75 #define NAND_MAX_OOBSIZE 64
76
77 /*
78 * Constants for hardware specific CLE/ALE/NCE function
79 */
80 /* Select the chip by setting nCE to low */
81 #define NAND_CTL_SETNCE 1
82 /* Deselect the chip by setting nCE to high */
83 #define NAND_CTL_CLRNCE 2
84 /* Select the command latch by setting CLE to high */
85 #define NAND_CTL_SETCLE 3
86 /* Deselect the command latch by setting CLE to low */
87 #define NAND_CTL_CLRCLE 4
88 /* Select the address latch by setting ALE to high */
89 #define NAND_CTL_SETALE 5
90 /* Deselect the address latch by setting ALE to low */
91 #define NAND_CTL_CLRALE 6
92 /* Set write protection by setting WP to high. Not used! */
93 #define NAND_CTL_SETWP 7
94 /* Clear write protection by setting WP to low. Not used! */
95 #define NAND_CTL_CLRWP 8
96
97 /*
98 * Standard NAND flash commands
99 */
100 #define NAND_CMD_READ0 0
101 #define NAND_CMD_READ1 1
102 #define NAND_CMD_PAGEPROG 0x10
103 #define NAND_CMD_READOOB 0x50
104 #define NAND_CMD_ERASE1 0x60
105 #define NAND_CMD_STATUS 0x70
106 #define NAND_CMD_STATUS_MULTI 0x71
107 #define NAND_CMD_SEQIN 0x80
108 #define NAND_CMD_READID 0x90
109 #define NAND_CMD_ERASE2 0xd0
110 #define NAND_CMD_RESET 0xff
111
112 /* Extended commands for large page devices */
113 #define NAND_CMD_READSTART 0x30
114 #define NAND_CMD_CACHEDPROG 0x15
115
116 /* Status bits */
117 #define NAND_STATUS_FAIL 0x01
118 #define NAND_STATUS_FAIL_N1 0x02
119 #define NAND_STATUS_TRUE_READY 0x20
120 #define NAND_STATUS_READY 0x40
121 #define NAND_STATUS_WP 0x80
122
123 /*
124 * Constants for ECC_MODES
125 */
126
127 /* No ECC. Usage is not recommended ! */
128 #define NAND_ECC_NONE 0
129 /* Software ECC 3 byte ECC per 256 Byte data */
130 #define NAND_ECC_SOFT 1
131 /* Hardware ECC 3 byte ECC per 256 Byte data */
132 #define NAND_ECC_HW3_256 2
133 /* Hardware ECC 3 byte ECC per 512 Byte data */
134 #define NAND_ECC_HW3_512 3
135 /* Hardware ECC 3 byte ECC per 512 Byte data */
136 #define NAND_ECC_HW6_512 4
137 /* Hardware ECC 8 byte ECC per 512 Byte data */
138 #define NAND_ECC_HW8_512 6
139 /* Hardware ECC 12 byte ECC per 2048 Byte data */
140 #define NAND_ECC_HW12_2048 7
141
142 /*
143 * Constants for Hardware ECC
144 */
145 /* Reset Hardware ECC for read */
146 #define NAND_ECC_READ 0
147 /* Reset Hardware ECC for write */
148 #define NAND_ECC_WRITE 1
149 /* Enable Hardware ECC before syndrom is read back from flash */
150 #define NAND_ECC_READSYN 2
151
152 /* Option constants for bizarre disfunctionality and real
153 * features
154 */
155 /* Chip can not auto increment pages */
156 #define NAND_NO_AUTOINCR 0x00000001
157 /* Buswitdh is 16 bit */
158 #define NAND_BUSWIDTH_16 0x00000002
159 /* Device supports partial programming without padding */
160 #define NAND_NO_PADDING 0x00000004
161 /* Chip has cache program function */
162 #define NAND_CACHEPRG 0x00000008
163 /* Chip has copy back function */
164 #define NAND_COPYBACK 0x00000010
165 /* AND Chip which has 4 banks and a confusing page / block
166 * assignment. See Renesas datasheet for further information */
167 #define NAND_IS_AND 0x00000020
168 /* Chip has a array of 4 pages which can be read without
169 * additional ready /busy waits */
170 #define NAND_4PAGE_ARRAY 0x00000040
171
172 /* Options valid for Samsung large page devices */
173 #define NAND_SAMSUNG_LP_OPTIONS \
174 (NAND_NO_PADDING | NAND_CACHEPRG | NAND_COPYBACK)
175
176 /* Macros to identify the above */
177 #define NAND_CANAUTOINCR(chip) (!(chip->options & NAND_NO_AUTOINCR))
178 #define NAND_MUST_PAD(chip) (!(chip->options & NAND_NO_PADDING))
179 #define NAND_HAS_CACHEPROG(chip) ((chip->options & NAND_CACHEPRG))
180 #define NAND_HAS_COPYBACK(chip) ((chip->options & NAND_COPYBACK))
181
182 /* Mask to zero out the chip options, which come from the id table */
183 #define NAND_CHIPOPTIONS_MSK (0x0000ffff & ~NAND_NO_AUTOINCR)
184
185 /* Non chip related options */
186 /* Use a flash based bad block table. This option is passed to the
187 * default bad block table function. */
188 #define NAND_USE_FLASH_BBT 0x00010000
189 /* The hw ecc generator provides a syndrome instead a ecc value on read
190 * This can only work if we have the ecc bytes directly behind the
191 * data bytes. Applies for DOC and AG-AND Renesas HW Reed Solomon generators */
192 #define NAND_HWECC_SYNDROME 0x00020000
193
194
195 /* Options set by nand scan */
196 /* Nand scan has allocated oob_buf */
197 #define NAND_OOBBUF_ALLOC 0x40000000
198 /* Nand scan has allocated data_buf */
199 #define NAND_DATABUF_ALLOC 0x80000000
200
201
202 /*
203 * nand_state_t - chip states
204 * Enumeration for NAND flash chip state
205 */
206 typedef enum {
207 FL_READY,
208 FL_READING,
209 FL_WRITING,
210 FL_ERASING,
211 FL_SYNCING,
212 FL_CACHEDPRG,
213 } nand_state_t;
214
215 /* Keep gcc happy */
216 struct nand_chip;
217
218 #if 0
219 /**
220 * struct nand_hw_control - Control structure for hardware controller (e.g ECC generator) shared among independend devices
221 * @lock: protection lock
222 * @active: the mtd device which holds the controller currently
223 */
224 struct nand_hw_control {
225 spinlock_t lock;
226 struct nand_chip *active;
227 };
228 #endif
229
230 /**
231 * struct nand_chip - NAND Private Flash Chip Data
232 * @IO_ADDR_R: [BOARDSPECIFIC] address to read the 8 I/O lines of the flash device
233 * @IO_ADDR_W: [BOARDSPECIFIC] address to write the 8 I/O lines of the flash device
234 * @read_byte: [REPLACEABLE] read one byte from the chip
235 * @write_byte: [REPLACEABLE] write one byte to the chip
236 * @read_word: [REPLACEABLE] read one word from the chip
237 * @write_word: [REPLACEABLE] write one word to the chip
238 * @write_buf: [REPLACEABLE] write data from the buffer to the chip
239 * @read_buf: [REPLACEABLE] read data from the chip into the buffer
240 * @verify_buf: [REPLACEABLE] verify buffer contents against the chip data
241 * @select_chip: [REPLACEABLE] select chip nr
242 * @block_bad: [REPLACEABLE] check, if the block is bad
243 * @block_markbad: [REPLACEABLE] mark the block bad
244 * @hwcontrol: [BOARDSPECIFIC] hardwarespecific function for accesing control-lines
245 * @dev_ready: [BOARDSPECIFIC] hardwarespecific function for accesing device ready/busy line
246 * If set to NULL no access to ready/busy is available and the ready/busy information
247 * is read from the chip status register
248 * @cmdfunc: [REPLACEABLE] hardwarespecific function for writing commands to the chip
249 * @waitfunc: [REPLACEABLE] hardwarespecific function for wait on ready
250 * @calculate_ecc: [REPLACEABLE] function for ecc calculation or readback from ecc hardware
251 * @correct_data: [REPLACEABLE] function for ecc correction, matching to ecc generator (sw/hw)
252 * @enable_hwecc: [BOARDSPECIFIC] function to enable (reset) hardware ecc generator. Must only
253 * be provided if a hardware ECC is available
254 * @erase_cmd: [INTERN] erase command write function, selectable due to AND support
255 * @scan_bbt: [REPLACEABLE] function to scan bad block table
256 * @eccmode: [BOARDSPECIFIC] mode of ecc, see defines
257 * @eccsize: [INTERN] databytes used per ecc-calculation
258 * @eccbytes: [INTERN] number of ecc bytes per ecc-calculation step
259 * @eccsteps: [INTERN] number of ecc calculation steps per page
260 * @chip_delay: [BOARDSPECIFIC] chip dependent delay for transfering data from array to read regs (tR)
261 * @chip_lock: [INTERN] spinlock used to protect access to this structure and the chip
262 * @wq: [INTERN] wait queue to sleep on if a NAND operation is in progress
263 * @state: [INTERN] the current state of the NAND device
264 * @page_shift: [INTERN] number of address bits in a page (column address bits)
265 * @phys_erase_shift: [INTERN] number of address bits in a physical eraseblock
266 * @bbt_erase_shift: [INTERN] number of address bits in a bbt entry
267 * @chip_shift: [INTERN] number of address bits in one chip
268 * @data_buf: [INTERN] internal buffer for one page + oob
269 * @oob_buf: [INTERN] oob buffer for one eraseblock
270 * @oobdirty: [INTERN] indicates that oob_buf must be reinitialized
271 * @data_poi: [INTERN] pointer to a data buffer
272 * @options: [BOARDSPECIFIC] various chip options. They can partly be set to inform nand_scan about
273 * special functionality. See the defines for further explanation
274 * @badblockpos: [INTERN] position of the bad block marker in the oob area
275 * @numchips: [INTERN] number of physical chips
276 * @chipsize: [INTERN] the size of one chip for multichip arrays
277 * @pagemask: [INTERN] page number mask = number of (pages / chip) - 1
278 * @pagebuf: [INTERN] holds the pagenumber which is currently in data_buf
279 * @autooob: [REPLACEABLE] the default (auto)placement scheme
280 * @bbt: [INTERN] bad block table pointer
281 * @bbt_td: [REPLACEABLE] bad block table descriptor for flash lookup
282 * @bbt_md: [REPLACEABLE] bad block table mirror descriptor
283 * @badblock_pattern: [REPLACEABLE] bad block scan pattern used for initial bad block scan
284 * @controller: [OPTIONAL] a pointer to a hardware controller structure which is shared among multiple independend devices
285 * @priv: [OPTIONAL] pointer to private chip date
286 */
287
288 struct nand_chip {
289 void __iomem *IO_ADDR_R;
290 void __iomem *IO_ADDR_W;
291
292 u_char (*read_byte)(struct mtd_info *mtd);
293 void (*write_byte)(struct mtd_info *mtd, u_char byte);
294 u16 (*read_word)(struct mtd_info *mtd);
295 void (*write_word)(struct mtd_info *mtd, u16 word);
296
297 void (*write_buf)(struct mtd_info *mtd, const u_char *buf, int len);
298 void (*read_buf)(struct mtd_info *mtd, u_char *buf, int len);
299 int (*verify_buf)(struct mtd_info *mtd, const u_char *buf, int len);
300 void (*select_chip)(struct mtd_info *mtd, int chip);
301 int (*block_bad)(struct mtd_info *mtd, loff_t ofs, int getchip);
302 int (*block_markbad)(struct mtd_info *mtd, loff_t ofs);
303 void (*hwcontrol)(struct mtd_info *mtd, int cmd);
304 int (*dev_ready)(struct mtd_info *mtd);
305 void (*cmdfunc)(struct mtd_info *mtd, unsigned command, int column, int page_addr);
306 int (*waitfunc)(struct mtd_info *mtd, struct nand_chip *this, int state);
307 int (*calculate_ecc)(struct mtd_info *mtd, const u_char *dat, u_char *ecc_code);
308 int (*correct_data)(struct mtd_info *mtd, u_char *dat, u_char *read_ecc, u_char *calc_ecc);
309 void (*enable_hwecc)(struct mtd_info *mtd, int mode);
310 void (*erase_cmd)(struct mtd_info *mtd, int page);
311 int (*scan_bbt)(struct mtd_info *mtd);
312 int eccmode;
313 int eccsize;
314 int eccbytes;
315 int eccsteps;
316 int chip_delay;
317 #if 0
318 spinlock_t chip_lock;
319 wait_queue_head_t wq;
320 nand_state_t state;
321 #endif
322 int page_shift;
323 int phys_erase_shift;
324 int bbt_erase_shift;
325 int chip_shift;
326 u_char *data_buf;
327 u_char *oob_buf;
328 int oobdirty;
329 u_char *data_poi;
330 unsigned int options;
331 int badblockpos;
332 int numchips;
333 unsigned long chipsize;
334 int pagemask;
335 int pagebuf;
336 struct nand_oobinfo *autooob;
337 uint8_t *bbt;
338 struct nand_bbt_descr *bbt_td;
339 struct nand_bbt_descr *bbt_md;
340 struct nand_bbt_descr *badblock_pattern;
341 struct nand_hw_control *controller;
342 void *priv;
343 };
344
345 /*
346 * NAND Flash Manufacturer ID Codes
347 */
348 #define NAND_MFR_TOSHIBA 0x98
349 #define NAND_MFR_SAMSUNG 0xec
350 #define NAND_MFR_FUJITSU 0x04
351 #define NAND_MFR_NATIONAL 0x8f
352 #define NAND_MFR_RENESAS 0x07
353 #define NAND_MFR_STMICRO 0x20
354
355 /**
356 * struct nand_flash_dev - NAND Flash Device ID Structure
357 *
358 * @name: Identify the device type
359 * @id: device ID code
360 * @pagesize: Pagesize in bytes. Either 256 or 512 or 0
361 * If the pagesize is 0, then the real pagesize
362 * and the eraseize are determined from the
363 * extended id bytes in the chip
364 * @erasesize: Size of an erase block in the flash device.
365 * @chipsize: Total chipsize in Mega Bytes
366 * @options: Bitfield to store chip relevant options
367 */
368 struct nand_flash_dev {
369 char *name;
370 int id;
371 unsigned long pagesize;
372 unsigned long chipsize;
373 unsigned long erasesize;
374 unsigned long options;
375 };
376
377 /**
378 * struct nand_manufacturers - NAND Flash Manufacturer ID Structure
379 * @name: Manufacturer name
380 * @id: manufacturer ID code of device.
381 */
382 struct nand_manufacturers {
383 int id;
384 char * name;
385 };
386
387 extern struct nand_flash_dev nand_flash_ids[];
388 extern struct nand_manufacturers nand_manuf_ids[];
389
390 /**
391 * struct nand_bbt_descr - bad block table descriptor
392 * @options: options for this descriptor
393 * @pages: the page(s) where we find the bbt, used with option BBT_ABSPAGE
394 * when bbt is searched, then we store the found bbts pages here.
395 * Its an array and supports up to 8 chips now
396 * @offs: offset of the pattern in the oob area of the page
397 * @veroffs: offset of the bbt version counter in the oob are of the page
398 * @version: version read from the bbt page during scan
399 * @len: length of the pattern, if 0 no pattern check is performed
400 * @maxblocks: maximum number of blocks to search for a bbt. This number of
401 * blocks is reserved at the end of the device where the tables are
402 * written.
403 * @reserved_block_code: if non-0, this pattern denotes a reserved (rather than
404 * bad) block in the stored bbt
405 * @pattern: pattern to identify bad block table or factory marked good /
406 * bad blocks, can be NULL, if len = 0
407 *
408 * Descriptor for the bad block table marker and the descriptor for the
409 * pattern which identifies good and bad blocks. The assumption is made
410 * that the pattern and the version count are always located in the oob area
411 * of the first block.
412 */
413 struct nand_bbt_descr {
414 int options;
415 int pages[NAND_MAX_CHIPS];
416 int offs;
417 int veroffs;
418 uint8_t version[NAND_MAX_CHIPS];
419 int len;
420 int maxblocks;
421 int reserved_block_code;
422 uint8_t *pattern;
423 };
424
425 /* Options for the bad block table descriptors */
426
427 /* The number of bits used per block in the bbt on the device */
428 #define NAND_BBT_NRBITS_MSK 0x0000000F
429 #define NAND_BBT_1BIT 0x00000001
430 #define NAND_BBT_2BIT 0x00000002
431 #define NAND_BBT_4BIT 0x00000004
432 #define NAND_BBT_8BIT 0x00000008
433 /* The bad block table is in the last good block of the device */
434 #define NAND_BBT_LASTBLOCK 0x00000010
435 /* The bbt is at the given page, else we must scan for the bbt */
436 #define NAND_BBT_ABSPAGE 0x00000020
437 /* The bbt is at the given page, else we must scan for the bbt */
438 #define NAND_BBT_SEARCH 0x00000040
439 /* bbt is stored per chip on multichip devices */
440 #define NAND_BBT_PERCHIP 0x00000080
441 /* bbt has a version counter at offset veroffs */
442 #define NAND_BBT_VERSION 0x00000100
443 /* Create a bbt if none axists */
444 #define NAND_BBT_CREATE 0x00000200
445 /* Search good / bad pattern through all pages of a block */
446 #define NAND_BBT_SCANALLPAGES 0x00000400
447 /* Scan block empty during good / bad block scan */
448 #define NAND_BBT_SCANEMPTY 0x00000800
449 /* Write bbt if neccecary */
450 #define NAND_BBT_WRITE 0x00001000
451 /* Read and write back block contents when writing bbt */
452 #define NAND_BBT_SAVECONTENT 0x00002000
453 /* Search good / bad pattern on the first and the second page */
454 #define NAND_BBT_SCAN2NDPAGE 0x00004000
455
456 /* The maximum number of blocks to scan for a bbt */
457 #define NAND_BBT_SCAN_MAXBLOCKS 4
458
459 extern int nand_scan_bbt (struct mtd_info *mtd, struct nand_bbt_descr *bd);
460 extern int nand_update_bbt (struct mtd_info *mtd, loff_t offs);
461 extern int nand_default_bbt (struct mtd_info *mtd);
462 extern int nand_isbad_bbt (struct mtd_info *mtd, loff_t offs, int allowbbt);
463 extern int nand_erase_nand (struct mtd_info *mtd, struct erase_info *instr, int allowbbt);
464
465 /*
466 * Constants for oob configuration
467 */
468 #define NAND_SMALL_BADBLOCK_POS 5
469 #define NAND_LARGE_BADBLOCK_POS 0
470
471 #endif /* __LINUX_MTD_NAND_H */