* NAND family Bad Block Management (BBM) header file
* - Bad Block Table (BBT) implementation
*
- * Copyright (c) 2005-2007 Samsung Electronics
+ * Copyright © 2005 Samsung Electronics
* Kyungmin Park <kyungmin.park@samsung.com>
*
- * Copyright (c) 2000-2005
+ * Copyright © 2000-2005
* Thomas Gleixner <tglx@linuxtronix.de>
*
- * This program is free software; you can redistribute it and/or modify
- * it under the terms of the GNU General Public License version 2 as
- * published by the Free Software Foundation.
+ * SPDX-License-Identifier: GPL-2.0+
+ *
*/
#ifndef __LINUX_MTD_BBM_H
#define __LINUX_MTD_BBM_H
/* The maximum number of NAND chips in an array */
-#ifndef NAND_MAX_CHIPS
-#define NAND_MAX_CHIPS 8
+#ifndef CONFIG_SYS_NAND_MAX_CHIPS
+#define CONFIG_SYS_NAND_MAX_CHIPS 1
#endif
/**
* struct nand_bbt_descr - bad block table descriptor
- * @param options options for this descriptor
- * @param pages the page(s) where we find the bbt, used with
- * option BBT_ABSPAGE when bbt is searched,
- * then we store the found bbts pages here.
- * Its an array and supports up to 8 chips now
- * @param offs offset of the pattern in the oob area of the page
- * @param veroffs offset of the bbt version counter in the oob are of the page
- * @param version version read from the bbt page during scan
- * @param len length of the pattern, if 0 no pattern check is performed
- * @param maxblocks maximum number of blocks to search for a bbt. This number of
- * blocks is reserved at the end of the device
- * where the tables are written.
- * @param reserved_block_code if non-0, this pattern denotes a reserved
- * (rather than bad) block in the stored bbt
- * @param pattern pattern to identify bad block table or factory marked
- * good / bad blocks, can be NULL, if len = 0
+ * @options: options for this descriptor
+ * @pages: the page(s) where we find the bbt, used with option BBT_ABSPAGE
+ * when bbt is searched, then we store the found bbts pages here.
+ * Its an array and supports up to 8 chips now
+ * @offs: offset of the pattern in the oob area of the page
+ * @veroffs: offset of the bbt version counter in the oob are of the page
+ * @version: version read from the bbt page during scan
+ * @len: length of the pattern, if 0 no pattern check is performed
+ * @maxblocks: maximum number of blocks to search for a bbt. This number of
+ * blocks is reserved at the end of the device where the tables are
+ * written.
+ * @reserved_block_code: if non-0, this pattern denotes a reserved (rather than
+ * bad) block in the stored bbt
+ * @pattern: pattern to identify bad block table or factory marked good /
+ * bad blocks, can be NULL, if len = 0
*
* Descriptor for the bad block table marker and the descriptor for the
* pattern which identifies good and bad blocks. The assumption is made
*/
struct nand_bbt_descr {
int options;
- int pages[NAND_MAX_CHIPS];
+ int pages[CONFIG_SYS_NAND_MAX_CHIPS];
int offs;
int veroffs;
- uint8_t version[NAND_MAX_CHIPS];
+ uint8_t version[CONFIG_SYS_NAND_MAX_CHIPS];
int len;
int maxblocks;
int reserved_block_code;
#define NAND_BBT_LASTBLOCK 0x00000010
/* The bbt is at the given page, else we must scan for the bbt */
#define NAND_BBT_ABSPAGE 0x00000020
-/* The bbt is at the given page, else we must scan for the bbt */
-#define NAND_BBT_SEARCH 0x00000040
/* bbt is stored per chip on multichip devices */
#define NAND_BBT_PERCHIP 0x00000080
/* bbt has a version counter at offset veroffs */
#define NAND_BBT_VERSION 0x00000100
-/* Create a bbt if none axists */
+/* Create a bbt if none exists */
#define NAND_BBT_CREATE 0x00000200
-/* Search good / bad pattern through all pages of a block */
-#define NAND_BBT_SCANALLPAGES 0x00000400
-/* Scan block empty during good / bad block scan */
-#define NAND_BBT_SCANEMPTY 0x00000800
+/*
+ * Create an empty BBT with no vendor information. Vendor's information may be
+ * unavailable, for example, if the NAND controller has a different data and OOB
+ * layout or if this information is already purged. Must be used in conjunction
+ * with NAND_BBT_CREATE.
+ */
+#define NAND_BBT_CREATE_EMPTY 0x00000400
/* Write bbt if neccecary */
-#define NAND_BBT_WRITE 0x00001000
+#define NAND_BBT_WRITE 0x00002000
/* Read and write back block contents when writing bbt */
-#define NAND_BBT_SAVECONTENT 0x00002000
+#define NAND_BBT_SAVECONTENT 0x00004000
/* Search good / bad pattern on the first and the second page */
-#define NAND_BBT_SCAN2NDPAGE 0x00004000
+#define NAND_BBT_SCAN2NDPAGE 0x00008000
+/* Search good / bad pattern on the last page of the eraseblock */
+#define NAND_BBT_SCANLASTPAGE 0x00010000
+/*
+ * Use a flash based bad block table. By default, OOB identifier is saved in
+ * OOB area. This option is passed to the default bad block table function.
+ */
+#define NAND_BBT_USE_FLASH 0x00020000
+/*
+ * Do not store flash based bad block table marker in the OOB area; store it
+ * in-band.
+ */
+#define NAND_BBT_NO_OOB 0x00040000
+/*
+ * Do not write new bad block markers to OOB; useful, e.g., when ECC covers
+ * entire spare area. Must be used with NAND_BBT_USE_FLASH.
+ */
+#define NAND_BBT_NO_OOB_BBM 0x00080000
+
+/*
+ * Flag set by nand_create_default_bbt_descr(), marking that the nand_bbt_descr
+ * was allocated dynamicaly and must be freed in nand_release(). Has no meaning
+ * in nand_chip.bbt_options.
+ */
+#define NAND_BBT_DYNAMICSTRUCT 0x80000000
/* The maximum number of blocks to scan for a bbt */
#define NAND_BBT_SCAN_MAXBLOCKS 4
/*
* Constants for oob configuration
*/
-#define ONENAND_BADBLOCK_POS 0
+#define NAND_SMALL_BADBLOCK_POS 5
+#define NAND_LARGE_BADBLOCK_POS 0
+#define ONENAND_BADBLOCK_POS 0
+
+/*
+ * Bad block scanning errors
+ */
+#define ONENAND_BBT_READ_ERROR 1
+#define ONENAND_BBT_READ_ECC_ERROR 2
+#define ONENAND_BBT_READ_FATAL_ERROR 4
/**
- * struct bbt_info - [GENERIC] Bad Block Table data structure
- * @param bbt_erase_shift [INTERN] number of address bits in a bbt entry
- * @param badblockpos [INTERN] position of the bad block marker in the oob area
- * @param bbt [INTERN] bad block table pointer
- * @param badblock_pattern [REPLACEABLE] bad block scan pattern used for initial bad block scan
- * @param priv [OPTIONAL] pointer to private bbm date
+ * struct bbm_info - [GENERIC] Bad Block Table data structure
+ * @bbt_erase_shift: [INTERN] number of address bits in a bbt entry
+ * @badblockpos: [INTERN] position of the bad block marker in the oob area
+ * @options: options for this descriptor
+ * @bbt: [INTERN] bad block table pointer
+ * @isbad_bbt: function to determine if a block is bad
+ * @badblock_pattern: [REPLACEABLE] bad block scan pattern used for
+ * initial bad block scan
+ * @priv: [OPTIONAL] pointer to private bbm date
*/
struct bbm_info {
int bbt_erase_shift;
uint8_t *bbt;
- int (*isbad_bbt) (struct mtd_info * mtd, loff_t ofs, int allowbbt);
+ int (*isbad_bbt)(struct mtd_info *mtd, loff_t ofs, int allowbbt);
/* TODO Add more NAND specific fileds */
struct nand_bbt_descr *badblock_pattern;
};
/* OneNAND BBT interface */
-extern int onenand_scan_bbt (struct mtd_info *mtd, struct nand_bbt_descr *bd);
-extern int onenand_default_bbt (struct mtd_info *mtd);
+extern int onenand_scan_bbt(struct mtd_info *mtd, struct nand_bbt_descr *bd);
+extern int onenand_default_bbt(struct mtd_info *mtd);
-#endif /* __LINUX_MTD_BBM_H */
+#endif /* __LINUX_MTD_BBM_H */