]> git.ipfire.org Git - thirdparty/kernel/linux.git/commitdiff
media: ov5640: Disable transparent feature for test pattern
authorChen-Yu Tsai <wens@csie.org>
Fri, 18 Jan 2019 08:52:03 +0000 (03:52 -0500)
committerMauro Carvalho Chehab <mchehab+samsung@kernel.org>
Mon, 18 Feb 2019 16:28:49 +0000 (11:28 -0500)
The transparent feature for test patterns blends the test pattern with
an actual captured image. This makes the result non-static, subject to
changes in the sensor's field of view.

Test patterns should be predictable and deterministic, even if they are
dynamic patterns. Disable the transparent feature of the test pattern.

Signed-off-by: Chen-Yu Tsai <wens@csie.org>
Signed-off-by: Sakari Ailus <sakari.ailus@linux.intel.com>
Signed-off-by: Mauro Carvalho Chehab <mchehab+samsung@kernel.org>
drivers/media/i2c/ov5640.c

index 22d07b3cc8a2d7c7e3857d9556d0a3802f6b2e8e..a1fd69a21df1f08ad5fcd18b9d162797939aefb4 100644 (file)
@@ -2461,8 +2461,7 @@ static const char * const test_pattern_menu[] = {
 
 static const u8 test_pattern_val[] = {
        0,
-       OV5640_TEST_ENABLE | OV5640_TEST_TRANSPARENT |
-               OV5640_TEST_BAR_VERT_CHANGE_1 |
+       OV5640_TEST_ENABLE | OV5640_TEST_BAR_VERT_CHANGE_1 |
                OV5640_TEST_BAR,
 };