When gcc build with --enable-deafult-pie the following tests
were getting failed:
FAIL: gcc.target/i386/pr90579.c scan-assembler vaddsd\tr\\+40
FAIL: gcc.target/i386/pr90579.c scan-assembler vaddsd\tr\\+32
FAIL: gcc.target/i386/pr90579.c scan-assembler vaddsd\tr\\+24
FAIL: gcc.target/i386/pr90579.c scan-assembler vaddsd\tr\\+16
PR target/118885
gcc/testsuite/ChangeLog:
* gcc.target/i386/pr90579.c: add -fno-pie to dg-options
to fix tests when PIE is enabled.
Signed-off-by: Harish Sadineni <Harish.Sadineni@windriver.com>
(cherry picked from commit
679e24f5a751663998ff7202149a749e0f7251f9)
/* { dg-do compile } */
-/* { dg-options "-O3 -mavx2 -mfpmath=sse" } */
+/* { dg-options "-O3 -mavx2 -mfpmath=sse -fno-pie" } */
extern double r[6];
extern double a[];