From 4910da6b36b122db50a27fabf6ab7f8611b60bf8 Mon Sep 17 00:00:00 2001 From: Pei Xiao Date: Fri, 5 Dec 2025 11:15:13 +0800 Subject: [PATCH] hwmon: (emc2305) fix device node refcount leak in error path The for_each_child_of_node() macro automatically manages device node reference counts during normal iteration. However, when breaking out of the loop early with return, the current iteration's node is not automatically released, leading to a reference count leak. Fix this by adding of_node_put(child) before returning from the loop when emc2305_set_single_tz() fails. This issue could lead to memory leaks over multiple probe cycles. Signed-off-by: Pei Xiao Link: https://lore.kernel.org/r/tencent_5CDC08544C901D5ECA270573D5AEE3117108@qq.com Signed-off-by: Guenter Roeck --- drivers/hwmon/emc2305.c | 4 +++- 1 file changed, 3 insertions(+), 1 deletion(-) diff --git a/drivers/hwmon/emc2305.c b/drivers/hwmon/emc2305.c index b0f2318c97e33..ceae96c07ac45 100644 --- a/drivers/hwmon/emc2305.c +++ b/drivers/hwmon/emc2305.c @@ -683,8 +683,10 @@ static int emc2305_probe(struct i2c_client *client) i = 0; for_each_child_of_node(dev->of_node, child) { ret = emc2305_set_single_tz(dev, child, i); - if (ret != 0) + if (ret != 0) { + of_node_put(child); return ret; + } i++; } } else { -- 2.47.3