These gimplefe tests never got the desired optimization on ia32, but
they only started visibly failing when the representation of MEMs in
dumps changed from printing 'symbol: a' to '&a'.
The transformation is not considered profitable on ia32, that's why it
doesn't take place. Maybe that's a bug in itself, but it's not a
regression, and not something to be noisy about.
for gcc/testsuite/ChangeLog
* gcc.dg/tree-ssa/scev-3.c: xfail on ia32.
* gcc.dg/tree-ssa/scev-5.c: Likewise.