The existing 'lib/test_bitops.c' is preserved as-is because it contains
ad-hoc micro-benchmarks 'test_fns' and is intended to ensure no compiler
warnings from C=1 sparse checker or -Wextra compilations.
Introduce 'lib/tests/bitops_kunit.c' for functional regression testing. It
ports the test logic and data patterns from 'lib/test_bitops.c' to KUnit,
verifying correct behavior across various input patterns and
architecture-specific edge cases using isolated stack-allocated bitmaps.
The following test logic has been ported from test_bitops_startup() in
lib/test_bitops.c:
- set_bit() / clear_bit() / find_first_bit() validation ->
test_set_bit_clear_bit()
- get_count_order() validation -> test_get_count_order()
- get_count_order_long() validation -> test_get_count_order_long()
Also improve the find_first_bit() test to check the full bitmap length
(BITOPS_LENGTH) instead of omitting the last bit, ensuring the bitmap is
completely empty after cleanup.
Verified on x86_64, i386, and arm64 architectures.
Sample KUnit output:
KTAP version 1
# Subtest: bitops
# module: bitops_kunit
1..3
KTAP version 1
# Subtest: test_set_bit_clear_bit
ok 1 BITOPS_4
ok 2 BITOPS_7
ok 3 BITOPS_11
ok 4 BITOPS_31
ok 5 BITOPS_88
# test_set_bit_clear_bit: pass:5 fail:0 skip:0 total:5
ok 1 test_set_bit_clear_bit
KTAP version 1
# Subtest: test_get_count_order
ok 1 0x00000003
ok 2 0x00000004
ok 3 0x00001fff
ok 4 0x00002000
ok 5 0x50000000
ok 6 0x80000000
ok 7 0x80003000
# test_get_count_order: pass:7 fail:0 skip:0 total:7
ok 2 test_get_count_order
KTAP version 1
# Subtest: test_get_count_order_long
ok 1 0x0000000300000000
ok 2 0x0000000400000000
ok 3 0x00001fff00000000
ok 4 0x0000200000000000
ok 5 0x5000000000000000
ok 6 0x8000000000000000
ok 7 0x8000300000000000
# test_get_count_order_long: pass:7 fail:0 skip:0 total:7
ok 3 test_get_count_order_long