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(parent: 1d75351) | patch
Added command-line options -s and -t such that the loop step and hence the run time...
authorBart Van Assche <bvanassche@acm.org>
Tue, 13 May 2008 16:17:05 +0000 (16:17 +0000)
committerBart Van Assche <bvanassche@acm.org>
Tue, 13 May 2008 16:17:05 +0000 (16:17 +0000)
commit432ce0faf3961ce9f6cd3898b1880c5ae38cf29a
tree155187d4ee1b8ff8e76acbfd9aca598b1359a9c0tree
parent1d7535150596faf850ff0b42cb81526fa8021caccommit | diff
Added command-line options -s and -t such that the loop step and hence the run time of the test can be influenced.

git-svn-id: svn://svn.valgrind.org/valgrind/trunk@8061
exp-drd/tests/drd_bitmap_test.c diff | blob | blame | history
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