$ git log --oneline
0c76c951620f9e12df2a89b2c684878b55bb6795..
6e489c17f827317bcf8544efefa65f13b5a079dc
6e489c17f8 Fix error reporting (false negatives) in SGID tests
11e634ccf3 support: Pick group in support_capture_subprogram_self_sgid if UID == 0
61e461ed0c sparc: Fix sparc32 Fix argument passing to __libc_start_main (BZ 32981)
Testing Results:
Before After Diff
PASS 5801 5809 +8
XPASS 4 4 0
FAIL 266 261 -5
XFAIL 16 16 0
UNSUPPORTED 164 161 -3
6e489c17f8 Fix error reporting (false negatives) in SGID tests
Improved SGID test handling by unifying error reporting and using secure temporary directories.
Replaced non-standard exit codes and fixed premature exits to avoid masking failures.
These changes reduced false negatives, increasing overall test pass rates.
UNSUPPORTED tests changes
-UNSUPPORTED: stdlib/tst-secure-getenv
-UNSUPPORTED: elf/tst-env-setuid-static
-UNSUPPORTED: elf/tst-env-setuid-tunables
FAILed tests changes
-FAIL: stdio-common/bug22
-FAIL: stdio-common/tst-printf-format-f-char
-FAIL: stdio-common/tst-printf-format-v-uchar
-FAIL: stdio-common/tst-printf-format-v-ullong
-FAIL: stdio-common/tst-printf-format-vas-double-F
PASSed tests changes
+PASS: stdlib/tst-secure-getenv
+PASS: elf/tst-env-setuid-static
+PASS: elf/tst-env-setuid-tunables
+PASS: stdio-common/bug22
+PASS: stdio-common/tst-printf-format-f-char
+PASS: stdio-common/tst-printf-format-v-uchar
+PASS: stdio-common/tst-printf-format-v-ullong
+PASS: stdio-common/tst-printf-format-vas-double-F
Signed-off-by: Deepesh Varatharajan <Deepesh.Varatharajan@windriver.com>
Signed-off-by: Mathieu Dubois-Briand <mathieu.dubois-briand@bootlin.com>
Signed-off-by: Richard Purdie <richard.purdie@linuxfoundation.org>