$ git log --oneline
0c76c951620f9e12df2a89b2c684878b55bb6795..
6e489c17f827317bcf8544efefa65f13b5a079dc
6e489c17f8 Fix error reporting (false negatives) in SGID tests
11e634ccf3 support: Pick group in support_capture_subprogram_self_sgid if UID == 0
61e461ed0c sparc: Fix sparc32 Fix argument passing to __libc_start_main (BZ 32981)
Testing Results:
Before After Diff
PASS 5803 5813 +10
XPASS 4 4 0
FAIL 266 257 -9
XFAIL 16 16 0
UNSUPPORTED 164 161 -3
6e489c17f8 Fix error reporting (false negatives) in SGID tests
Improved SGID test handling by unifying error reporting and using secure temporary directories.
Replaced non-standard exit codes and fixed premature exits to avoid masking failures.
These changes reduced false negatives, increasing overall test pass rates.
UNSUPPORTED tests changes
-UNSUPPORTED: stdlib/tst-secure-getenv
-UNSUPPORTED: elf/tst-env-setuid-static
-UNSUPPORTED: elf/tst-env-setuid-tunables
FAILed tests changes
+FAIL: elf/tst-env-setuid-tunables
-FAIL: stdio-common/tst-printf-format-d-int
-FAIL: stdio-common/tst-printf-format-d-long
-FAIL: stdio-common/tst-printf-format-sn-ushort
-FAIL: stdio-common/tst-printf-format-v-short
-FAIL: stdio-common/tst-printf-format-v-ushort
-FAIL: stdio-common/tst-printf-format-vas-double-f
-FAIL: stdio-common/tst-printf-format-vas-double-g
-FAIL: stdio-common/tst-printf-format-vas-double-g-mem
-FAIL: stdio-common/tst-printf-format-vas-int
PASSed tests changes
+PASS: stdlib/tst-secure-getenv
+PASS: elf/tst-env-setuid-static
+PASS: stdio-common/tst-printf-format-d-int
+PASS: stdio-common/tst-printf-format-d-long
+PASS: stdio-common/tst-printf-format-sn-ushort
+PASS: stdio-common/tst-printf-format-v-short
+PASS: stdio-common/tst-printf-format-v-ushort
+PASS: stdio-common/tst-printf-format-vas-double-f
+PASS: stdio-common/tst-printf-format-vas-double-g
+PASS: stdio-common/tst-printf-format-vas-double-g-mem
+PASS: stdio-common/tst-printf-format-vas-int
Signed-off-by: Deepesh Varatharajan <Deepesh.Varatharajan@windriver.com>
Signed-off-by: Steve Sakoman <steve@sakoman.com>