From: Radoslav Kolev <radoslav.kolev@suse.com>
Date: Tue, 14 May 2024 07:39:29 +0000 (+0300)
Subject: sd-event: increase test-event timeout to 120s
X-Git-Tag: v256-rc2~20
X-Git-Url: http://git.ipfire.org/cgi-bin/gitweb.cgi?a=commitdiff_plain;h=381c3b64d0a80ccda2ccb0dda6fe825878a6e150;p=thirdparty%2Fsystemd.git

sd-event: increase test-event timeout to 120s

The test-event test seems to be taking quite a bit more time than
the other 'simple tests', which usually complete in < 1s. In case
of a slower or loaded machine the default 30s timeout is not enough.
---

diff --git a/src/libsystemd/meson.build b/src/libsystemd/meson.build
index 817e3a5e090..6d4337d1a7f 100644
--- a/src/libsystemd/meson.build
+++ b/src/libsystemd/meson.build
@@ -158,6 +158,10 @@ libsystemd_tests += [
                 'sources' : files('sd-journal/test-journal-enum.c'),
                 'timeout' : 360,
         },
+        {
+                'sources' : files('sd-event/test-event.c'),
+                'timeout' : 120,
+        }
 ]
 
 ############################################################
@@ -170,7 +174,6 @@ simple_tests += files(
         'sd-device/test-device-util.c',
         'sd-device/test-sd-device-monitor.c',
         'sd-device/test-sd-device.c',
-        'sd-event/test-event.c',
         'sd-journal/test-journal-flush.c',
         'sd-journal/test-journal-interleaving.c',
         'sd-journal/test-journal-stream.c',