sd-event: increase test-event timeout to 120s

The test-event test seems to be taking quite a bit more time than
the other 'simple tests', which usually complete in < 1s. In case
of a slower or loaded machine the default 30s timeout is not enough.

diff --git a/src/libsystemd/meson.build b/src/libsystemd/meson.build
index 817e3a5e090f6cf9a9deb279f926afed30a1eaab..6d4337d1a7f1c92b08dc7943c59b89407516f5bc 100644 (file)
--- a/src/libsystemd/meson.build
+++ b/src/libsystemd/meson.build
@@ -158,6 +158,10 @@ libsystemd_tests += [
                 'sources' : files('sd-journal/test-journal-enum.c'),
                 'timeout' : 360,
         },
+        {
+                'sources' : files('sd-event/test-event.c'),
+                'timeout' : 120,
+        }
 ]
 
 ############################################################
@@ -170,7 +174,6 @@ simple_tests += files(
         'sd-device/test-device-util.c',
         'sd-device/test-sd-device-monitor.c',
         'sd-device/test-sd-device.c',
-        'sd-event/test-event.c',
         'sd-journal/test-journal-flush.c',
         'sd-journal/test-journal-interleaving.c',
         'sd-journal/test-journal-stream.c',