iio: ABI: Fix wrong format of differential capacitance channel ABI.

[ Upstream commit 1efc41035f1841acf0af2bab153158e27ce94f10 ]

in_ only occurs once in these attributes.

Fixes: 0baf29d658c7 ("staging:iio:documentation Add abi docs for capacitance adcs.")
Signed-off-by: Jonathan Cameron <Jonathan.Cameron@huawei.com>
Reviewed-by: Andy Shevchenko <andy.shevchenko@gmail.com>
Link: https://lore.kernel.org/r/20220626122938.582107-3-jic23@kernel.org
Signed-off-by: Sasha Levin <sashal@kernel.org>

diff --git a/Documentation/ABI/testing/sysfs-bus-iio b/Documentation/ABI/testing/sysfs-bus-iio
index 743ffbcc6b5f087ce47cd5a070adf5ffc207473e..2d1f8f803fb27e1305649e1ec7a4a9b165df54c5 100644 (file)
--- a/Documentation/ABI/testing/sysfs-bus-iio
+++ b/Documentation/ABI/testing/sysfs-bus-iio
@@ -125,7 +125,7 @@ Description:
                Raw capacitance measurement from channel Y. Units after
                application of scale and offset are nanofarads.
 
-What:          /sys/.../iio:deviceX/in_capacitanceY-in_capacitanceZ_raw
+What:          /sys/.../iio:deviceX/in_capacitanceY-capacitanceZ_raw
 KernelVersion: 3.2
 Contact:       linux-iio@vger.kernel.org
 Description: