Restored original bitmap test patterns.

git-svn-id: svn://svn.valgrind.org/valgrind/trunk@7972

diff --git a/exp-drd/drd_bitmap.c b/exp-drd/drd_bitmap.c
index e89cb2367d86f731d32beb63a29fc8de57b2098d..99b3f13ccf2d1eca19c4ad6e95da2b66dcf2d08d 100644 (file)
--- a/exp-drd/drd_bitmap.c
+++ b/exp-drd/drd_bitmap.c
@@ -1009,14 +1009,14 @@ static void bm2_merge(struct bitmap2* const bm2l,
 static
 struct { Addr address; SizeT size; BmAccessTypeT access_type; }
   s_args[] = {
-    {    0 + ADDR0_COUNT, 1, eLoad  },
-    {  666 + ADDR0_COUNT, 4, eLoad  },
-    {  667 + ADDR0_COUNT, 2, eStore },
-    { -2 + 2*ADDR0_COUNT, 1, eStore },
-    {       0x0001ffffUL, 1, eLoad  },
-    {       0x0002ffffUL, 1, eLoad  },
-    {       0x00ffffffUL, 1, eLoad  },
-    {       0xffffffffUL, 1, eStore },
+    {            0, 1, eLoad  },
+    {          666, 4, eLoad  },
+    {          667, 2, eStore },
+    {         1024, 1, eStore },
+    {     0xffffUL, 1, eStore },
+    { 0x0001ffffUL, 1, eLoad  },
+    { 0x00ffffffUL, 1, eLoad  },
+    { 0xffffffffUL, 1, eStore },
   };
 
 void bm_test(void)