From: Julian Seward <jseward@acm.org>
Date: Tue, 15 Mar 2005 16:51:30 +0000 (+0000)
Subject: Somewhat reduce the number of immediate values in test-with-immediate
X-Git-Tag: svn/VALGRIND_3_0_1^2~299
X-Git-Url: http://git.ipfire.org/gitweb.cgi?a=commitdiff_plain;h=1bc1a47a028b85c80f5246ed7fc697261cb83a87;p=thirdparty%2Fvalgrind.git

Somewhat reduce the number of immediate values in test-with-immediate
style tests.


git-svn-id: svn://svn.valgrind.org/vex/trunk@1035
---

diff --git a/VEX/switchback/test_ppc_jm1.c b/VEX/switchback/test_ppc_jm1.c
index 34fa1d15a4..b33b4e6c7c 100644
--- a/VEX/switchback/test_ppc_jm1.c
+++ b/VEX/switchback/test_ppc_jm1.c
@@ -3694,7 +3694,7 @@ static void build_ii16_table (void)
 
     ii16 = my_malloc(200 * sizeof(uint32_t));
     i = 0;
-    for (tmp = 0; ; tmp = tmp + 1 + (tmp >> 2)) {
+    for (tmp = 0; ; tmp = tmp + 1 + (tmp>>1)+(tmp>>2)+(tmp>>3)) {
         if (tmp >= 0x10000)
             tmp = 0xFFFF;
         ii16[i++] = tmp;