From 381c3b64d0a80ccda2ccb0dda6fe825878a6e150 Mon Sep 17 00:00:00 2001 From: Radoslav Kolev Date: Tue, 14 May 2024 10:39:29 +0300 Subject: [PATCH] sd-event: increase test-event timeout to 120s The test-event test seems to be taking quite a bit more time than the other 'simple tests', which usually complete in < 1s. In case of a slower or loaded machine the default 30s timeout is not enough. --- src/libsystemd/meson.build | 5 ++++- 1 file changed, 4 insertions(+), 1 deletion(-) diff --git a/src/libsystemd/meson.build b/src/libsystemd/meson.build index 817e3a5e090..6d4337d1a7f 100644 --- a/src/libsystemd/meson.build +++ b/src/libsystemd/meson.build @@ -158,6 +158,10 @@ libsystemd_tests += [ 'sources' : files('sd-journal/test-journal-enum.c'), 'timeout' : 360, }, + { + 'sources' : files('sd-event/test-event.c'), + 'timeout' : 120, + } ] ############################################################ @@ -170,7 +174,6 @@ simple_tests += files( 'sd-device/test-device-util.c', 'sd-device/test-sd-device-monitor.c', 'sd-device/test-sd-device.c', - 'sd-event/test-event.c', 'sd-journal/test-journal-flush.c', 'sd-journal/test-journal-interleaving.c', 'sd-journal/test-journal-stream.c', -- 2.47.3