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tests: add test that DDF marks missing devices as failed on assembly.
authorNeilBrown <neilb@suse.de>
Tue, 11 Mar 2014 06:11:08 +0000 (17:11 +1100)
committerNeilBrown <neilb@suse.de>
Tue, 11 Mar 2014 06:11:08 +0000 (17:11 +1100)
commitfdcd157a8034fe5c896e49c4764d8ceef72e3741
tree425487c397283e351212c6664e662cd482d68614tree | snapshot
parent2167de78aab599e7a7a8d057ef04bf18527bc129commit | diff
tests: add test that DDF marks missing devices as failed  on assembly.

If we assemble a newly-degraded array, the missing devices must be marked
as 'failed' so we don't expect them in future.

Signed-off-by: NeilBrown <neilb@suse.de>
tests/10ddf-sudden-degraded [new file with mode: 0644] blob
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